drm/xe/gt: Fix assert in L3 bank mask generation
What needs to be asserted is that the pattern fits in the number of bits provided by the user in patternbits, otherwise it would be truncated when replicated according to the mask, which is likely not the intended use of this function. The pattern argument is a bitmap so use find_last_bit() instead of fls(). The bit position starts at index 0 so remove "or equal" from the comparison. XE_MAX_L3_BANK_MASK_BITS would be the returned value if the pattern is 0, which can be the case on some platforms. v2: Check the result does not overflow the array (Lucas De Marchi) v3: Use __fls() for long and handle mask == 0 (Lucas De Marchi) Cc: Matt Roper <matthew.d.roper@intel.com> Cc: Lucas De Marchi <lucas.demarchi@intel.com> Signed-off-by: Francois Dugast <francois.dugast@intel.com> Reviewed-by: Lucas De Marchi <lucas.demarchi@intel.com> Link: https://patchwork.freedesktop.org/patch/msgid/20240502124311.159695-1-francois.dugast@intel.com Signed-off-by: Lucas De Marchi <lucas.demarchi@intel.com>
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Lucas De Marchi
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ae22b2f1c8
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@@ -108,7 +108,9 @@ gen_l3_mask_from_pattern(struct xe_device *xe, xe_l3_bank_mask_t dst,
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{
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unsigned long bit;
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xe_assert(xe, fls(mask) <= patternbits);
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xe_assert(xe, find_last_bit(pattern, XE_MAX_L3_BANK_MASK_BITS) < patternbits ||
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bitmap_empty(pattern, XE_MAX_L3_BANK_MASK_BITS));
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xe_assert(xe, !mask || patternbits * (__fls(mask) + 1) <= XE_MAX_L3_BANK_MASK_BITS);
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for_each_set_bit(bit, &mask, 32) {
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xe_l3_bank_mask_t shifted_pattern = {};
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